Prof.Dr. EMRE COŞKUN

Yayın Ağı

SCI, SSCI ve AHCI İndekslerine Giren Dergilerde Yayınlanan Makaleler

A new method to determine the continuous refractive index of an absorbing film by Generalized Stockwell Transform

COŞKUN E., Emir C., Selamet S., PARLAK M., ÖZDER S.

Optics and Laser Technology , cilt.167, 2023 (SCI-Expanded)

Nanowire geometry effects on devices and transport mechanisms: SnS2/SiNW heterojunction

Coşkun E., Emir C., Terlemezoglu M., Parlak M.

JOURNAL OF MATERIALS SCIENCE , cilt.58, ss.15132-15143, 2023 (SCI-Expanded)

Improvement of electrical characteristics of SnSe/Si heterostructure by integration of Si nanowires

Coşkun E., Gullu H. H., Emir C., Parlak M.

PHYSICA B-CONDENSED MATTER , cilt.604, 2021 (SCI-Expanded)

Simultaneous determination of the thickness and refractive index dispersion of dielectric films by the Paul wavelet transform

ÖZCAN S., COŞKUN E., KOCAHAN YILMAZ Ö., ÖZDER S.

THIN SOLID FILMS , cilt.692, 2019 (SCI-Expanded)

FABRICATION AND CHARACTERIZATION OF TiO2 THIN FILM FOR DEVICE APPLICATIONS

Hosseini A., Gullu H. H., Coskun E., Parlak M., Ercelebi C.

SURFACE REVIEW AND LETTERS , cilt.26, sa.6, 2019 (SCI-Expanded)

Effects of Si nanowire on the device properties of n-ZnSe/p-Si heterostructure

Coskun E., Gullu H. H., Colakoglu T., Emir C., Bozdogan E., Parlak M.

JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , cilt.30, sa.5, ss.4760-4765, 2019 (SCI-Expanded)

The zero order generalized Morse wavelet method to determine the refractive index and extinction coefficient dispersions of an absorbing film

KOCAHAN YILMAZ Ö., COŞKUN E., Tiryaki E., ÖZDER S.

THIN SOLID FILMS , cilt.673, ss.72-77, 2019 (SCI-Expanded)

Optical band gap and dispersion of optical constants of Cu-Ga-S thin films

Isik M., Gullu H. H., Coskun E., HASANLI N.

OPTIK , cilt.186, ss.147-154, 2019 (SCI-Expanded)

Determination of phase from the ridge of CWT using generalized Morse wavelet

KOCAHAN YILMAZ Ö., Tiryaki E., COŞKUN E., ÖZDER S.

MEASUREMENT SCIENCE AND TECHNOLOGY , cilt.29, sa.3, 2018 (SCI-Expanded)

The generalized Morse wavelet method to determine refractive index dispersion of dielectric films

KOCAHAN YILMAZ Ö., ÖZCAN S., COŞKUN E., ÖZDER S.

MEASUREMENT SCIENCE AND TECHNOLOGY , cilt.28, sa.4, 2017 (SCI-Expanded)

Investigations of thermal annealing role on the optical properties of Zn-In-Se thin films

Gullu H. H., COŞKUN E., Parlak M.

OPTIK , cilt.144, ss.603-612, 2017 (SCI-Expanded)

Generalized Morse wavelet for the determination of the birefringence of a liquid crystal cell

KOCAHAN YILMAZ Ö., COŞKUN E., ÖZDER S.

MEASUREMENT SCIENCE AND TECHNOLOGY , cilt.26, sa.8, 2015 (SCI-Expanded)

Device behavior of an In/p-Ag(Ga,In)Te-2/n-Si/Ag heterojunction diode

COŞKUN E., Gullu H. H., CANDAN İ., Bayrakli O., PARLAK M., Ercelebi C.

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING , cilt.34, ss.138-145, 2015 (SCI-Expanded)

Study on the Structural and Electrical Properties of Sequentially Deposited Ag-Ga-In-Te Thin Films

COŞKUN E., Gullu H. H., Parlak M., Ercelebi C.

JOURNAL OF LOW TEMPERATURE PHYSICS , cilt.178, ss.162-173, 2015 (SCI-Expanded)

Investigation of structural and optical parameters of Cu-Ag-In-Se thin films deposited by thermal evaporation method

Gullu H. H., CANDAN İ., COŞKUN E., Parlak M.

OPTIK , cilt.126, sa.18, ss.1578-1583, 2015 (SCI-Expanded)

Device application of AgGa0.5In0.5Se2 thin films deposited by thermal sequential stacked layer method

COŞKUN E., Gullu H. H., Parlak M.

MATERIALS RESEARCH EXPRESS , cilt.1, sa.4, 2014 (SCI-Expanded)

Characterization of Co-evaporated Cu-Ag-In-Se Thin Films

Gullu H. H., COŞKUN E., Parlak M.

BRAZILIAN JOURNAL OF PHYSICS , cilt.44, sa.6, ss.719-725, 2014 (SCI-Expanded)

Generalized Morse wavelets for the phase evaluation of projected fringe pattern

KOCAHAN YILMAZ Ö., COŞKUN E., ÖZDER S.

MEASUREMENT SCIENCE AND TECHNOLOGY , cilt.25, sa.10, 2014 (SCI-Expanded)

The Paul wavelet algorithm: an alternative approach to calculate the refractive index dispersion of a dielectric film from transmittance spectrum

COŞKUN E., ÖZDER S., Tiryaki E.

APPLIED PHYSICS B-LASERS AND OPTICS , cilt.113, sa.2, ss.243-250, 2013 (SCI-Expanded)

Structural and optical properties of Zn-In-Te thin films deposited by thermal evaporation technique

Gullu H. H., Bayrakli O., CANDAN İ., COŞKUN E., Parlak M.

JOURNAL OF ALLOYS AND COMPOUNDS , cilt.566, ss.83-89, 2013 (SCI-Expanded)

Paul wavelet algorithm for the determination of birefringence dispersion of a liquid crystal cell

COŞKUN E., ÖZDER S.

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS , cilt.28, sa.12, ss.2974-2978, 2011 (SCI-Expanded)

Determination of the refractive index of a dielectric film continuously by the generalized S-transform

COŞKUN E., SEL K., ÖZDER S.

OPTICS LETTERS , cilt.35, sa.6, ss.841-843, 2010 (SCI-Expanded)

Refractive index and extinction coefficient determination of an absorbing thin film by using the continuous wavelet transform method

COŞKUN E., SEL K., ÖZDER S., KURT M.

APPLIED OPTICS , cilt.47, sa.27, ss.4888-4894, 2008 (SCI-Expanded)

Determination of birefringence dispersion in nematic liquid crystals by using an S-transform

Ozder S., COŞKUN E., Koysal O., Kocahan O.

OPTICS LETTERS , cilt.32, sa.14, ss.2001-2003, 2007 (SCI-Expanded)

Optical phase distribution evaluation by using an S-transform

Ozder S., KOCAHAN O., COŞKUN E., Goktas H.

OPTICS LETTERS , cilt.32, sa.6, ss.591-593, 2007 (SCI-Expanded)

The effect of thermal annealing on impurity states in ferroelectric-semiconductor TlGaSe2 within the incommensurate phase

Seyidov M., COŞKUN E., Sahin Y., Khamoev R., Suleymanov R.

SEMICONDUCTOR SCIENCE AND TECHNOLOGY , cilt.21, sa.2, ss.171-174, 2006 (SCI-Expanded)

Diğer Dergilerde Yayınlanan Makaleler

An improved method for determination of refractive index of absorbing films: A simulation study

Özcan S., Coşkun E., Kocahan Yılmaz Ö., Özder S.

AIP Conference Proceedings , cilt.1815, ss.500091-500094, 2017 (Hakemli Dergi)

An Improved Method For The Determination Of Birefringence Dispersion Of Liquid Crystal Cell: A Simulation Study

Özcan S., Coşkun E., Kocahan Yılmaz Ö., Özder S.

AIP Conference Proceedings , cilt.1722, sa.1, ss.900021-900024, 2016 (Düzenli olarak gerçekleştirilen hakemli kongrenin bildiri kitabı)

Hakemli Kongre / Sempozyum Bildiri Kitaplarında Yer Alan Yayınlar

Numerical Approach for Determination of The Refractive Index of Dielectric Film from Reflectance Spectrum at Various Angles of Incidence by Using Paul Wavelet

SELAMET S., TİRYAKİ E., Emir C., COŞKUN E.

Türk Fizik Derneği 39. Kongresi (2023), Muğla, Türkiye, 31 Ağustos - 04 Eylül 2023, ss.128

Surface Profile Determination by Generalized Morse Wavelet: A Simulation Study

UYANIK M., SELAMET S., KOCAHAN YILMAZ Ö., COŞKUN E.

Türk Fizik Derneği 38. Kongresi (2022), Muğla, Türkiye, 31 Ağustos 2022

Determination of the theoretically created surface profile by Generalized S-Transform

SELAMET S., KOCAHAN YILMAZ Ö., COŞKUN E.

Türk Fizik Derneği 38. Kongresi (2022), Muğla, Türkiye, 31 Ağustos 2022

Cardiac tissue models to investigate the heart mechanobiology

Zanetti M., Andolfi L., Guttner E. B., COŞKUN E., BEK A., Taylor M. R., et al.

Crossnano Workshop 2022, İtalya, 22 Şubat 2022

TEMPERATURE DEPENDENT CHARACTERIZATION OF SnS/Si NANOWIRE DEVICE APPLICATION

COŞKUN E., GÜLLÜ H. H., EMİR C., PARLAK M.

Turk Fizik Derneği 36 sempozyum, İstanbul, Türkiye, 01 Eylül 2020, ss.78

Determination of surface profile of thin films by continuous wavelet transform.

TİRYAKİ E., KOCAHAN YILMAZ Ö., COŞKUN E., ÖZDER S.

6. International Conference of Material Science and Nanotechnology for Next Generation (MSNG2019), Kayseri, Türkiye, 16 - 17 Ekim 2019

Electrical Properties of ZnSe/Si Nanowire and ZnSe/Si Heterostructures

BOZDOĞAN E., COŞKUN E., ÖZDER S., GÜLLÜ H. H., PARLAK M.

Turkish Physical Society 34th International Physics Congress (TFD-34), Muğla, Türkiye, 5 - 09 Eylül 2018

n-ZnSe/p-Si Nanotel Heteroeklemlerin Foto-İletkenlik Davranışlarının İncelenmesi

COŞKUN E., GÜLLÜ H. H., PARLAK M.

23. Yoğun Madde Fiziği Ankara Toplantısı, Ankara, Türkiye, 22 Aralık 2017

Determination of the Interface Properties of p-CZTSe/n-Si Nanowire Heterojunction Diode

BAYRAKLI Ö., TERLEMEZOĞLU M., GÜLLÜ H. H., YILDIZ D. E., ÇOLAKOĞLU T., COŞKUN E., et al.

Materials Research Society (MRS) 2017 Fall Meeting, Boston, 26 Kasım - 01 Aralık 2017

Optical properties of slicon nanowires for different length fabricated by metal assisted chemical ethcing method

BOZDOĞAN E., COŞKUN E., ÖZDER S., KOCAHAN YILMAZ Ö.

Turkish Physical Society 33th International Physics Congress, 6 - 09 Eylül 2017

Production of silicon nanowire having different size by using metal assisted chemical etching method

BOZDOĞAN E., COŞKUN E., ÖZDER S., KOCAHAN YILMAZ Ö.

Turkish Physical Society 33th International Physics Congress, 6 - 09 Eylül 2017

Synthesis and Structural Characterization on the (Cu,Ag)GaTe2 Thin Films Deposited on Si Nanowires

COŞKUN E., GÜLLÜ H. H., BAYRAKLI Ö., TERLEMEZOĞLU M., PARLAK M.

European Materials Research Society-Spring Meeting 2017, 22 - 26 Mayıs 2017

A Simulation Study for Determination of Refractive Index Dispersion of Dielectric Film from Reflectance Spectrum by Using Paul Wavelet

Tiryaki E., COŞKUN E., KOCAHAN YILMAZ Ö., ÖZDER S.

32nd International Physics Congress of Turkish-Physical-Society (TPS), Bodrum, Türkiye, 6 - 09 Eylül 2016, cilt.1815

Optical Phase Distribution Evaluation by Using Zero Order Generalized Morse Wavelet

KOCAHAN YILMAZ Ö., Elmas M. N., Durmus C., COŞKUN E., Tiryaki E., ÖZDER S.

32nd International Physics Congress of Turkish-Physical-Society (TPS), Bodrum, Türkiye, 6 - 09 Eylül 2016, cilt.1815

Quantitative Phase Imaging of Red Blood Cell by Diffraction Phase Microscopy

KOCAHAN YILMAZ Ö., Tiryaki E., Durmus C., Elmas M. N., COŞKUN E., ÖZDER S.

International Workshop on Computing and Electromagnetics (CEM), Barcelona, İspanya, 21 - 24 Haziran 2017, ss.21-22

An Improved Method For Determination Of Refractive Index Of Absorbing Films: A Simulation Study

Özcan S., Coşkun E., Kocahan Yılmaz Ö., Özder S.

32nd International Physics Congress of Turkish-Physical-Society (TPS), Bodrum, Türkiye, 6 - 09 Eylül 2016, cilt.1815

3D Profile Measurements of Objects by Using Zero Order Generalized Morse Wavelet

KOCAHAN YILMAZ Ö., Durmus C., Elmas M. N., COŞKUN E., Tiryaki E., ÖZDER S.

32nd International Physics Congress of Turkish-Physical-Society (TPS), Bodrum, Türkiye, 6 - 09 Eylül 2016, cilt.1815

An Improved Method For Simultaneous Determination Of Refractive Index And Thickness Of Dielectric Films A Simulation Study

ÖZCAN S., COŞKUN E., KOCAHAN YILMAZ Ö., ÖZDER S.

Science and Applications of Thin Films, Congress & Exhibition - SATF 2016, İzmir, Türkiye, 19 - 23 Eylül 2016

Design and Device Application of Si Based Cu Ag Ga Te Thin Film Heterojunction

GÜLLÜ H. H., COŞKUN E., BAYRAKLI Ö., PARLAK M.

Science and Application of Thin Films, Conference and Exhibition, 19 - 23 Eylül 2016

Determination of the Refractive Index of Dielectric Films from the Transmittance Spectrum by Using Morse Wavelet

TİRYAKİ E., KOCAHAN YILMAZ Ö., COŞKUN E., ELMAS M. N., ÖZDER S.

Science and Applications of Thin Films, Conference & Exhibition SATF 2016, 19 - 23 Eylül 2016

Theoretical Determination of the Refractive Index and Extinction Coefficient of an Absorbing Thin Film by Using Morse Wavelet

TİRYAKİ E., KOCAHAN YILMAZ Ö., COŞKUN E., DURMUŞ Ç., ÖZDER S.

Science and Applications of Thin Films, Conference & Exhibition (SATF 2016), 19 - 23 Eylül 2016